FDTD Simulation of Novel Polarimetric and Directional Refelectance and Transmittance Measurements from Optical Nano- and Micro-Structured Materials
The basic physics of nano-/micro-structured materials must be categorized through measurements and simulation to fully understand their scatter dependence on polarization and angle on incidence before they can be considered for war fighter applications. The off-normal incidence and polarization depe...
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| Format: | text |
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AFIT Scholar
2012
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| Online Access: | https://scholar.afit.edu/etd/1189 https://scholar.afit.edu/context/etd/article/2192/viewcontent/AFIT_EE_ABET_ENP_12_M02_Sellers_a557538.pdf |
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