Electromigration in ULSI interconnections
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| Main Author: | |
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| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hackensack, N.J. :
World Scientific,
c2010.
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| Series: | International series on advances in solid state electronics and technology.
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| Subjects: | |
| Online Access: | Click to View |
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