Electron microscopy and analysis

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Bibliographic Details
Main Author:	Goodhew, Peter J.
Corporate Author:	ProQuest (Firm)
Other Authors:	Beanland, R., Humphreys, F. J.
Format:	Electronic eBook
Language:	English
Published:	London : Taylor & Francis, 2001.
Edition:	3rd ed.
Subjects:	Electron microscopy. Electronic books.
Online Access:	Click to View
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LEADER	00000nam a2200000 a 4500
001	EBC168520
003	MiAaPQ
005	20241107122340.0
006	m o d \|
007	cr cnu\|\|\|\|\|\|\|\|
008	010730s2001 enka ob 001 0 eng
015			\|a GBA1-43398
016	7		\|z 0748409688 \|2 Uk
020			\|a 9780203184257 \|q (electronic bk.)
020			\|z 9780748409686 \|q (print)
035			\|a (MiAaPQ)EBC168520
035			\|a (Au-PeEL)EBL168520
035			\|a (CaPaEBR)ebr10017829
035			\|a (CaONFJC)MIL277797
035			\|a (OCoLC)70724582
040			\|a MiAaPQ \|b eng \|e rda \|e pn \|c MiAaPQ \|d MiAaPQ
050		4	\|a QH212.E4 \|b G62 2001
082	0		\|a 502.825 \|2 21
100	1		\|a Goodhew, Peter J.
245	1	0	\|a Electron microscopy and analysis \|h [electronic resource] / \|c Peter J. Goodhew, John Humphreys, Richard Beanland.
250			\|a 3rd ed.
260			\|a London : \|b Taylor & Francis, \|c 2001.
300			\|a xi, 251 p. : \|b ill.
500			\|a Previous ed.: 1988.
504			\|a Includes bibliographical references and index.
590			\|a Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650		0	\|a Electron microscopy.
655		4	\|a Electronic books.
700	1		\|a Beanland, R.
700	1		\|a Humphreys, F. J.
710	2		\|a ProQuest (Firm)
797	2		\|a ProQuest (Firm)
856	4	0	\|u https://ebookcentral.proquest.com/lib/kaiptc/detail.action?docID=168520 \|z Click to View
942			\|c PQEBOOK
999			\|c 5107 \|d 5107