Electron microscopy and analysis

Saved in:
Bibliographic Details
Main Author: Goodhew, Peter J.
Corporate Author: ProQuest (Firm)
Other Authors: Beanland, R., Humphreys, F. J.
Format: Electronic eBook
Language:English
Published: London : Taylor & Francis, 2001.
Edition:3rd ed.
Subjects:
Online Access:Click to View
Tags: Add Tag
No Tags, Be the first to tag this record!