Goodhew, P. J., Beanland, R., & Humphreys, F. J. (2001). Electron microscopy and analysis (3rd ed.). Taylor & Francis.
Citación estilo ChicagoGoodhew, Peter J., R. Beanland, and F. J. Humphreys. Electron Microscopy and Analysis. 3rd ed. London: Taylor & Francis, 2001.
Cita MLAGoodhew, Peter J., et al. Electron Microscopy and Analysis. 3rd ed. Taylor & Francis, 2001.
Warning: These citations may not always be 100% accurate.
