Reliability of MEMS testing of materials and devices /

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Bibliographic Details
Corporate Author: ProQuest (Firm)
Other Authors: Tabata, Osamu, Tsuchiya, Toshiyuki
Format: Electronic eBook
Language:English
Published: Weinheim : Wiley-VCH, 2013.
Series:Advanced micro & nanosystems.
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Online Access:Click to View
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