Transient-induced latchup in CMOS integrated circuits

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Bibliographic Details
Main Author:	Ker, Ming-Dou
Corporate Author:	ProQuest (Firm)
Other Authors:	Hsu, Sheng-Fu
Format:	Electronic eBook
Language:	English
Published:	Singapore ; Hoboken, NJ : Wiley, c2009.
Subjects:	Metal oxide semiconductors, Complementary > Defects. Metal oxide semiconductors, Complementary > Reliability. Electronic books.
Online Access:	Click to View
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