Detection of Bacillus Spores by Aptamer Selectivity Using Atomic Force Microscopy
The anthrax attack of Oct 2001 demonstrates the need for a rapid detector for spores of Bacillus anthracis (BA). Current technology requires cultures of BA to be grown for 24 hours. Using aptamers, a type of nucleic acid ligand selective for a target molecule, to select BA spores for measurement wit...
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2005
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| Acceso en línea: | https://scholar.afit.edu/etd/3722 https://scholar.afit.edu/context/etd/article/4723/viewcontent/AFIT_GAP_ENP_05_03_Houtkooper_N_ADA438276.pdf |
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| _version_ | 1870451991155572736 |
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| author | Houtkooper, Nina M. |
| author_facet | Houtkooper, Nina M. |
| author_sort | Houtkooper, Nina M. |
| building | US Air Force Institute of Technology (AFIT) |
| collection | AFIT Scholar |
| description | The anthrax attack of Oct 2001 demonstrates the need for a rapid detector for spores of Bacillus anthracis (BA). Current technology requires cultures of BA to be grown for 24 hours. Using aptamers, a type of nucleic acid ligand selective for a target molecule, to select BA spores for measurement without culturing is a possible solution for quicker detection. An aptamer having a specially selected structure is expected to selectively bind to the surface of its target spore, separating it from other material. An atomic force microscopy (AFM) method was developed to test this selectivity. Aptamers having structure selected to recognize BA were attached to a silicon nitride AFM probe, which was put in contact with spores of Bacillus anthracis Sterne strain or B. thuringiensis var. kurstaki (BT). Using the AFM in contact mode, the adhesion force between the aptamer and the spores was measured. This research compared the difference in adhesion forces of a clean probe and a probe treated with these aptamers for both BA spores and BT spores to determine whether the enhanced selectivity of aptamers for BA compared with BT could be directly measured. |
| format | text |
| id | afit-etd-4723 |
| institution | US Air Force Institute of Technology |
| publishDate | 2005 |
| publisher | AFIT Scholar |
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| spelling | afit-etd-4723 Detection of Bacillus Spores by Aptamer Selectivity Using Atomic Force Microscopy Houtkooper, Nina M. The anthrax attack of Oct 2001 demonstrates the need for a rapid detector for spores of Bacillus anthracis (BA). Current technology requires cultures of BA to be grown for 24 hours. Using aptamers, a type of nucleic acid ligand selective for a target molecule, to select BA spores for measurement without culturing is a possible solution for quicker detection. An aptamer having a specially selected structure is expected to selectively bind to the surface of its target spore, separating it from other material. An atomic force microscopy (AFM) method was developed to test this selectivity. Aptamers having structure selected to recognize BA were attached to a silicon nitride AFM probe, which was put in contact with spores of Bacillus anthracis Sterne strain or B. thuringiensis var. kurstaki (BT). Using the AFM in contact mode, the adhesion force between the aptamer and the spores was measured. This research compared the difference in adhesion forces of a clean probe and a probe treated with these aptamers for both BA spores and BT spores to determine whether the enhanced selectivity of aptamers for BA compared with BT could be directly measured. 2005-03-01T08:00:00Z text application/pdf https://scholar.afit.edu/etd/3722 https://scholar.afit.edu/context/etd/article/4723/viewcontent/AFIT_GAP_ENP_05_03_Houtkooper_N_ADA438276.pdf Theses and Dissertations AFIT Scholar Bacillus anthracis Atomic force microscopy Atomic, Molecular and Optical Physics Biological and Chemical Physics |
| spellingShingle | Bacillus anthracis Atomic force microscopy Atomic, Molecular and Optical Physics Biological and Chemical Physics Houtkooper, Nina M. Detection of Bacillus Spores by Aptamer Selectivity Using Atomic Force Microscopy |
| title | Detection of Bacillus Spores by Aptamer Selectivity Using Atomic Force Microscopy |
| title_full | Detection of Bacillus Spores by Aptamer Selectivity Using Atomic Force Microscopy |
| title_fullStr | Detection of Bacillus Spores by Aptamer Selectivity Using Atomic Force Microscopy |
| title_full_unstemmed | Detection of Bacillus Spores by Aptamer Selectivity Using Atomic Force Microscopy |
| title_short | Detection of Bacillus Spores by Aptamer Selectivity Using Atomic Force Microscopy |
| title_sort | detection of bacillus spores by aptamer selectivity using atomic force microscopy |
| topic | Bacillus anthracis Atomic force microscopy Atomic, Molecular and Optical Physics Biological and Chemical Physics |
| url | https://scholar.afit.edu/etd/3722 https://scholar.afit.edu/context/etd/article/4723/viewcontent/AFIT_GAP_ENP_05_03_Houtkooper_N_ADA438276.pdf |
| work_keys_str_mv | AT houtkooperninam detectionofbacillussporesbyaptamerselectivityusingatomicforcemicroscopy |