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ESD failure mechanisms and models /

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Bibliographic Details
Main Author:	Voldman, Steven H.
Corporate Author:	ProQuest (Firm)
Format:	Electronic eBook
Language:	English
Published:	Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009.
Subjects:	Semiconductors > Failures. Integrated circuits > Protection. Integrated circuits > Testing. Integrated circuits > Reliability. Electric discharges. Electrostatics. Electronic books.
Online Access:	Click to View
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