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Leakage current and defect characterization of short channel MOSFETs /

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Bibliographic Details
Main Author:	Roll, Guntrade (Author)
Format:	Electronic eBook
Language:	English
Published:	Berlin : Logos Verlag Berlin, [2014]
Series:	Research at NaMLab ; 2
Subjects:	Metal oxide semiconductor field-effect transistors. Electronic books.
Online Access:	Click to View
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