Beam effects, surface topography, and depth profiling in surface analysis
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| Corporate Author: | |
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| Other Authors: | , , |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
New York :
Plenum Press,
c1998.
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| Series: | Methods of surface characterization ;
v. 5. |
| Subjects: | |
| Online Access: | Click to View |
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| Physical Description: | xix, 430 p. : ill. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9780306469145 |