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Scanning force microscopy with applications to electric, magnetic, and atomic forces /

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Detalles Bibliográficos
Autor Principal:	Sarid, Dror
Autor Corporativo:	ProQuest (Firm)
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	New York : Oxford University Press, 1994.
Edición:	Rev. ed.
Series:	Oxford series in optical and imaging sciences ; 5.
Subjects:	Scanning force microscopy. Surfaces (Physics) Electronic books.
Acceso en liña:	Click to View
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